JPH0441562Y2 - - Google Patents
Info
- Publication number
- JPH0441562Y2 JPH0441562Y2 JP9849386U JP9849386U JPH0441562Y2 JP H0441562 Y2 JPH0441562 Y2 JP H0441562Y2 JP 9849386 U JP9849386 U JP 9849386U JP 9849386 U JP9849386 U JP 9849386U JP H0441562 Y2 JPH0441562 Y2 JP H0441562Y2
- Authority
- JP
- Japan
- Prior art keywords
- image
- sample
- sample image
- electron microscope
- photographing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000010894 electron beam technology Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Image Processing (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9849386U JPH0441562Y2 (en]) | 1986-06-27 | 1986-06-27 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9849386U JPH0441562Y2 (en]) | 1986-06-27 | 1986-06-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS634056U JPS634056U (en]) | 1988-01-12 |
JPH0441562Y2 true JPH0441562Y2 (en]) | 1992-09-30 |
Family
ID=30966476
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9849386U Expired JPH0441562Y2 (en]) | 1986-06-27 | 1986-06-27 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0441562Y2 (en]) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4596881B2 (ja) * | 2004-10-26 | 2010-12-15 | 株式会社日立ハイテクノロジーズ | 透過型電子顕微鏡装置 |
JP5066056B2 (ja) * | 2008-10-31 | 2012-11-07 | 株式会社日立ハイテクノロジーズ | 試料観察方法、及び電子顕微鏡 |
-
1986
- 1986-06-27 JP JP9849386U patent/JPH0441562Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS634056U (en]) | 1988-01-12 |
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